SiO2 etching by Fluorocarbon plasma
Computational conditions
- 34 reactions including generation of complexes and polymers, ion assist etching are used.
- SiO2CxFy is the precursor to etching.
Result
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T=120 [s] SiO2 layer
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T=240 [s] SiO2 layer
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Polymer layer (T=120 [s] )
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Polymer layer (T=240 [s] )
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Solid layer (T=120 [s] )
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Solid layer (T=240 [s] )


![T=120 [s] SiO2 layer](http://www.psinc.co.jp/english/assets_c/2015/06/SiO2_T%3D120-thumb-300xauto-457.png)
![T=240 [s] SiO2 layer](http://www.psinc.co.jp/english/assets_c/2015/06/SiO2_T%3D240-thumb-300xauto-458.png)
![Polymer layer (T=120 [s] )](http://www.psinc.co.jp/english/assets_c/2015/06/Polymer_T%3D120-thumb-300xauto-459.png)
![Polymer layer (T=240 [s] )](http://www.psinc.co.jp/english/assets_c/2015/06/Polymer_T%3D240-thumb-300xauto-460.png)
![Solid layer (T=120 [s] )](http://www.psinc.co.jp/english/assets_c/2015/06/Profile_T%3D120-thumb-296x373-461.png)
![Solid layer (T=240 [s] )](http://www.psinc.co.jp/english/assets_c/2015/06/Profile_T%3D240-thumb-294x377-462.png)